MPXV2050 Просмотр технического описания (PDF) - Freescale Semiconductor

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MPXV2050

50 kPa On-Chip Temperature Compensated and Calibrated Silicon Pressure Sensors

Freescale Semiconductor 

Pressure

Operating Characteristics

Table 1. Operating Characteristics (VS = 10 VDC, TA = 25°C unless otherwise noted, P1 > P2)

Characteristic

Symbol

Min

Typ

Pressure Range(1)

Supply Voltage(2)

POP

0

—

VS

—

10

Supply Current

Full Scale Span(3)

Offset(4)

IO

—

6.0

VFS

38.5

40

—

–1.0

—

Max

50

16

—

41.5

1.0

Units

kPa

VDC

mAdc

mV

mV

Sensitivity

ΔV/ΔP

—

0.8

—

mV/kPa

Non-Linearity

Pressure Hysteresis (0 to 50 kPa)

Temperature Hysteresis (-40° to 125°C)

Temperature Coefficient of Full Scale

Temperature Coefficient of Offset

Input Impedance

Output Impedance

Response Time(5) (10% to 90%)

Warm-Up Time

Offset Stability(6)

—

—

—

TCVFS

TCVOFF

ZIN

ZOUT

tR

—

—

–0.3

—

—

–1.0

–1.0

1000

1400

—

—

—

—

±0.1

±0.5

—

—

—

—

1.0

20

±0.5

0.3

—

—

1.0

1.0

2500

3000

—

—

—

%VFS

%VFS

%VFS

%VFS

mV

Ω

Ω

ms

ms

%VFS

1. 1.0 kPa (kiloPascal) equals 0.145 psi.

2. Device is ratiometric within this specified excitation range. Operating the device above the specified excitation range may induce additional

error due to device self-heating.

3. Full Scale Span (VFSS) is defined as the algebraic difference between the output voltage at full rated pressure and the output voltage at the

minimum rated pressure.

4. Offset (Voff) is defined as the output voltage at the minimum rated pressure.

5. Response Time is defined as the time for the incremental change in the output to go from 10% to 90% of its final value when subjected to a

specified step change in pressure.

6. Offset stability is the product's output deviation when subjected to 1000 hours of Pulsed Pressure, Temperature Cycling with Bias Test.

Maximum Ratings

Table 2. Maximum Ratings(1)

Rating

Max Value

Supply Voltage

16

Pressure (P1 > P2)

200

Storage Temperature

–40 to +125

Operating Temperature Range

–40 to +125

1. Exposure beyond the specified limits may cause permanent damage or degradation to the device.

Unit

V

kPa

°C

°C

MPXV2050

2

Sensors

Freescale Semiconductor

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