M54HC32K Просмотр технического описания (PDF) - STMicroelectronics

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M54HC32K

Rad-hard high speed 2 to 6 V CMOS logic series

STMicroelectronics 

M54HCxxx - M54HCTxxx

4

Radiation data

Radiation data

Each wafer lot is qualified at 50 krad (Si) total dose as per ESCC 22900 specification at 210

rad/hour.

The HC/HCT series is characterized under heavy Ion on 4 functions representative of the

whole series and qualified as per the results of this characterization.

Detailed results are provided in the table below:

Table 6. Radiation data

Function

Gate: 54HC08

Multiplexer 54HC157

Flip-flop 54HC273

Counter 54HC4040

Analog Mux/Demux 54HC4053

Result

SEL and SEU free for LET [ 111 MeV/mg/cm²

SEL and SEU free for LET[ 111 MeV/mg/cm²

SEL free for LET [ 111 MeV/mg/cm²

SEU: LETth = 16MeV/mg/cm², σsat = 1.7x10-4 cm²

SEL free for LET [ 111 MeV/mg/cm²

SEU: LETth = 34MeV/mg/cm², σsat = 4.2x10-4 cm²

SEL free for LET [ 111 MeV/mg/cm²

SEU: LETth = 7MeV/mg/cm², σsat = 2.4x10-4 cm²”

Doc ID 17367 Rev 2

13/29

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