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LX8386-00IP Просмотр технического описания (PDF) - Microsemi Corporation

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LX8386-00IP
Microsemi
Microsemi Corporation Microsemi
LX8386-00IP Datasheet PDF : 11 Pages
1 2 3 4 5 6 7 8 9 10
LX8386x-xx
TM
®
1.5A Low Dropout Positive Regulators
PRODUCTION DATA SHEET
ELECTRICAL CHARACTERISTICS (CONTINUED)
Unless otherwise specified, the following specifications apply over the operating ambient temperature for the LX8386x-xxC with
0°C TA 125°C and the LX8386-xxI with -25°C TA 125°C except where otherwise noted. Test conditions: VIN -VOUT = 3V;
IOUT = 3A. Low duty cycle pulse testing techniques are used which maintains junction and case temperatures equal to the ambient
temperature.
Parameter
Symbol
Test Conditions
` LX8386-33 / 8386A-33 / 8386B-33 (3.3V FIXED)(CONTINUED)
Maximum Output Current
Temperature Stability (Note 3)
Long Term Stability (Note 3)
RMS Output Noise (% of VOUT)
(Note 3)
IOUT(MAX)
ΔVOUT(T)
ΔVOUT (t)
VOUT (RMS)
VIN < 7V
TA=125°C, 1000 hours
TA=25°C, 10Hz < f < 10kHz
LX8386x-xx
Units
Min Typ Max
1.5
2.0
A
0.25
%
0.3
1
%
0.003
%
Note 2
Note 3
Note 4
Regulation is measured at constant junction temperature, using pulse testing with a low duty cycle. Changes in output
voltage due to heating effects are covered under the specification for thermal regulation.
These parameters, although guaranteed are not tested in production.
See Maximum Output Current Section
Copyright © 2000
Rev. 2.0, 2005-11-02
Microsemi
Linfinity Microelectronics Division
11861 Western Avenue, Garden Grove, CA. 92841, 714-898-8121, Fax: 714-893-2570
Page 4

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