ISPLSI2096VL Просмотр технического описания (PDF) - Lattice Semiconductor
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ISPLSI2096VL Datasheet PDF : 11 Pages
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Specifications ispLSI 2096VL
Switching Test Conditions
Input Pulse Levels
Input Rise and Fall Time
GND to VCC
≤ 1.5ns 10% to 90%
Input Timing Reference Levels
Output Timing Reference Levels
Output Load
VCC/2
VCC/2
See Figure 2
3-state levels are measured 0.15V from
steady-state active level.
Table 2-0003/2096VL
Output Load Conditions (see Figure 2)
Figure 2. Test Load
VCC
R1
Device
Output
R2
Test
Point
CL*
TEST CONDITION
A
Active High
B
Active Low
Active High to Z
C
at VOH -0.15V
Active Low to Z
at VOL+0.15V
R1
250Ω
∞
250Ω
∞
R2
218Ω
218Ω
∞
218Ω
CL
35pF
35pF
35pF
5pF
250Ω
∞
5pF
Table 2-0004/2096VL
*CL includes Test Fixture and Probe Capacitance.
0213A/2096VL
DC Electrical Characteristics
Over Recommended Operating Conditions
SYMBOL
PARAMETER
CONDITION
MIN. TYP.3 MAX. UNITS
VOL
Output Low Voltage
VOH
Output High Voltage
IIL5
IIH
IIL-isp
IIL-PU
IOS1
ICC2, 4
Input or I/O Low Leakage Current
Input or I/O High Leakage Current
BSCAN Input Pull-Up Current
I/O Active Pull-Up Current
Output Short Circuit Current
Operating Power Supply Current
IOL = 100µA
IOL = 8mA
IOH = -100µA
IOH = -1mA
IOH = -4mA
0V ≤ VIN ≤ VIL (Max.)
VIH (min) ≤ VIN ≤ 3.6V
0V ≤ VIN ≤ VIL
0V ≤ VIN ≤ VIL
VCC= 2.5V, VOUT= 0.5V
VIL = 0.0V, VIH = 2.5V
fCLK = 1 MHz
—
— 0.2
V
—
— 0.4
V
VCC - 0.2 —
—
V
2.0
—
—
V
1.8
—
—
V
—
— -10 µA
—
— 10
µA
—
— -150 µA
—
— -150 µA
—
— -100 mA
— 85
— mA
1. One output at a time for a maximum duration of one second. VOUT = 0.5V was selected to avoid test
problems by tester ground degradation. Characterized but not 100% tested.
Table 2-0007/2096VL
2. Measured using six 16-bit counters.
3. Typical values are at VCC = 2.5V and TA = 25°C.
4. Maximum ICC varies widely with specific device configuration and operating frequency. Refer to Power Consumption
section of this data sheet and Thermal Management section of the Lattice Semiconductor Data Book or CD-ROM to
estimate maximum ICC.
5. With no pull-up resistors.
4
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