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ISL21010 Просмотр технического описания (PDF) - Intersil

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ISL21010 Datasheet PDF : 20 Pages
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ISL21010
Electrical Specifications (ISL21010-41, VOUT = 4.096V) VIN = 5.0V, TA = +25°C, IOUT = 0A, unless otherwise
specified. Boldface limits apply over the operating temperature range, -40°C to +125°C.
PARAMETER
DESCRIPTION
CONDITIONS
MIN
MAX
(Note 8) TYP (Note 8)
UNIT
VOUT
Output Voltage
4.096
V
VOA
VOUT Accuracy @ TA = +25°C (Note 7)
-0.2
+0.2
%
TC VOUT
Output Voltage Temperature Coefficient (Note 9)
15
50 ppm/°C
VIN
Input Voltage Range
4.2
5.5
V
IIN
Supply Current
TA = +25°C
48
80
µA
ΔVOUT /ΔVIN
ΔVOUT/ΔIOUT
Line Regulation
Load Regulation
TA = -40°C to +125°C
4.2 V < VIN < 5.5V
Sourcing: 0mA IOUT 25mA
Sinking: -1mA IOUT 0mA
100
µA
106 550
µV/V
50 140 µV/mA
50
µV/mA
VINDO
Dropout Voltage (Note 10)
IOUT = 10mA
60 150
mV
ISC
Short Circuit Current
TA = +25°C, VOUT tied to GND
126
mA
tR
Turn-on Settling Time
VOUT = ±0.1%, COUT = 1μF
300
µs
Ripple Rejection
f = 120Hz
58
dB
eN
VN
ΔVOUT/ΔTA
ΔVOUT/Δt
Output Voltage Noise
Broadband Voltage Noise
Thermal Hysteresis (Note 11)
Long Term Stability
0.1Hz f 10Hz
10Hz f 1kHz
ΔTA = +165°C
1000 hours, TA = +25°C
112
µVP-P
56
µVRMS
100
ppm
110
ppm
NOTES:
8. Compliance to datasheet limits is assured by one or more methods: production test, characterization and/or design.
9. Over the specified temperature range. Temperature coefficient is measured by the box method whereby the change in VOUT is divided by the
temperature range; in this case, -40°C to +125°C = +165°C.
10. Dropout Voltage is the minimum VIN - VOUT differential voltage measured at the point where VOUT drops 1mV from VIN = nominal at TA = +25°C.
11. Thermal Hysteresis is the change of VOUT measured @ TA = +25°C after temperature cycling over a specified range, ΔTA. VOUT is read initially at
TA = +25°C for the device under test. The device is temperature cycled and a second VOUT measurement is taken at +25°C. The difference between
the initial VOUT reading and the second VOUT reading is then expressed in ppm. For ΔTA = +165°C, the device under test is cycled from +25°C to
-40°C to +125°C to +25°C.
8
FN7896.1
December 8, 2011

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