IDT74CBTLV16214 Просмотр технического описания (PDF) - Integrated Device Technology
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IDT74CBTLV16214 Datasheet PDF : 5 Pages
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IDT74CBTLV16214
LOW-VOLTAGE 12-BIT 3:1 MUX / DEMUX BUS SWITCH
TEST CIRCUITS AND WAVEFORMS
TEST CONDITIONS
Symbol VCC(1)= 3.3V±0.3V
VCC(2)= 2.5V±0.2V
Unit
VLOAD
6
2 x Vcc
V
VIH
3
Vcc
V
VT
1.5
Vcc / 2
V
VLZ
300
150
mV
VHZ
300
150
mV
CL
50
30
pF
INDUSTRIAL TEMPERATURE RANGE
SAME PHASE
INPUT TRANSITION
tPLH
OUTPUT
tPLH
OPPOSITE PHASE
INPUT TRANSITION
VIH
VT
tPHL
0V
VOH
VT
tPHL
VOL
VIH
VT
0V
Propagation Delay
Pulse(1, 2)
VIN
Generator
VCC
VOUT
D.U.T.
500Ω
VLOAD
Open
GND
RT
500Ω
CL
Test Circuits for All Outputs
DEFINITIONS:
CL = Load capacitance: includes jig and probe capacitance.
RT = Termination resistance: should be equal to ZOUT of the Pulse Generator.
NOTES:
1. Pulse Generator for All Pulses: Rate ≤ 10MHz; tF ≤ 2.5ns; tR ≤ 2.5ns.
2. Pulse Generator for All Pulses: Rate ≤ 10MHz; tF ≤ 2ns; tR ≤ 2ns.
CONTROL
INPUT
ENABLE
tPZL
DISABLE
VIH
VT
tPLZ
0V
OUTPUT
NORMALLY
LOW
SWITCH
CLOSED
tPZH
VLOAD/2
VT
tPHZ
VLOAD/2
VOL + VLZ
VOL
OUTPUT SWITCH
NORMALLY OPEN
VT
HIGH
0V
VOH
VOH -VHZ
0V
NOTE:
1. Diagram shown for input Control Enable-LOW and input Control Disable-HIGH.
Enable and Disable Times
SWITCH POSITION
Test
tPLZ/tPZL
tPHZ/tPZH
tPD
Switch
VLOAD
GND
Open
4
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