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IDT71024S

CMOS Static RAM 1 Meg (128K x 8-Bit)

Integrated Device Technology 

IDT71024 CMOS Static RAM

1 Meg (128K x 8-Bit)

Commercial and Industrial Temperature Ranges

DC Electrical Characteristics

(VCC = 5.0V ± 10%, Commercial and Industrial Temperature Ranges)

IDT71024

Symbol

|ILI|

|ILO|

VOL

VOH

Parameter

Input Leakage Current

Output Leakage Current

Output Low Voltage

Output High Voltage

Test Condition

VCC = Max., VIN = GND to VCC

VCC = Max., CS1 = VIH, VOUT = GND to VCC

IOL = 8mA, VCC = Min.

IOH = –4mA, VCC = Min.

Min.

___

___

___

2.4

Max. Unit

5

µA

5

µA

0.4

V

___

V

2964 tbl 06

DC Electrical Characteristics(1)

(VCC = 5.0V ± 10%, VLC = 0.2V, VHC = VCC – 0.2V)

Symbol

ICC

ISB

ISB1

Parameters

Dynamic Operating Current,

CS2 ≥ VIH and CS1 ≤ VIL, Outputs Open,

VCC = Max., f = fMAX(2)

Standby Power Supply Current (TTL Level)

CS1 ≥ VIH or CS2 ≤ VIL, Outputs Open,

VCC = Max., f=fMAX(2)

Full Standby Power Supply Current

(CMOS Level), CS1 ≥ VHC or

CS2 ≤ VLC, Outputs Open,

VCC = Max., f = 0(2), VIN ≤ VLC or VIN ≥ VHC

71024S12

Com'l.

Ind.

160

160

40

40

10

10

NOTES:

1. All values are maximum guaranteed values.

2. fMAX = 1/tRC (all address inputs are cycling at fMAX); f = 0 means no address

input lines are changing.

71024S15

Com'l.

Ind.

155

155

71024S20

Com'l.

Ind.

140

140

40

40

40

40

10

10

10

10

Unit

mA

mA

mA

2964 tbl 07

AC Test Conditions

Input Pulse Levels

GND to 3.0V

Input Rise/Fall Times

3ns

Input Timing Reference Levels

1.5V

Output Reference Levels

1.5V

AC Test Load

See Figures 1 and 2

2964 tbl 08

5V

DATA OUT

30pF

480Ω

255Ω

2964 drw 03

Figure 1. AC Test Load

6.432

DATA OUT

5pF*

5V

480Ω

255Ω

2964 drw 04

*Including jig and scope capacitance.

Figure 2. AC Test Load

(for tCLZ, tOLZ, tCHZ, tOHZ, tOW, and tWHZ)

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