HCF4517BM1 Просмотр технического описания (PDF) - STMicroelectronics

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HCF4517BM1

DUAL 64 STAGE STATIC SHIFT REGISTER

STMicroelectronics 

HCF4517B

TEST CIRCUIT

TEST

tPLH, tPHL

tPZL, tPLZ

tPZH, tPHZ

CL = 50pF or equivalent (includes jig and probe capacitance)

RL = 200KΩ

RT = ZOUT of pulse generator (typically 50Ω)

WAVEFORM : PROPAGATION DELAY TIMES (f=1MHz; 50% duty cycle)

SWITCH

Open

VDD

VSS

6/8

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