![](/html/GSI/382631/page11.png)
Device Under Test
VDDQ = 1.5 V
DQ
25Ω
ZQ
RQ = 250Ω
Product Preview
GS8150V18/36AB-357/333/300/250
AC Test Load Diagram
50Ω
50Ω
5pF
VDDQ/2
VDDQ/2
50Ω
50Ω
5pF
VDDQ/2
Input and Output Leakage Characteristics
Parameter
Input Leakage Current
(except mode pins)
ZQ, MCH, MCL, EP2, EP3
Pin Input Current
Symbol
IIL
IINM
Output Leakage Current
IOL
Test Conditions
VIN = 0 to VDDQ
VIN = 0 to VDDQ
Output Disable,
VOUT = 0 to VDDQ
Min.
–2 uA
–50 uA
–2 uA
Max Notes
2 uA
—
50 uA
—
2 uA
—
Operating Currents
Parameter
Symbol
x36
IDD
Operating
Current
x18
IDD
HSTL
Deselect
IDD3
Current
-357
0°C –40°C
to
to
70°C +85°C
650 mA 660 mA
600 mA 610 mA
150 mA 160 mA
-333
0°C –40°C
to
to
70°C +85°C
600 mA 610 mA
550 mA 560 mA
150 mA 160 mA
-300
0°C –40°C
to
to
70°C +85°C
550 mA 560 mA
500 mA 510 mA
150 mA 160 mA
-250
0°C –40°C
to
to
70°C +85°C
500 mA 510 mA
450 mA 460 mA
150 mA 160 mA
Test Conditions
SS ≤ VIL Max.
tKHKH ≥ tKHKH Min.
All other inputs
VIL ≥ VIN ≥ VIH
Device Deselected
All inputs
VSS + 0.10 V
≥ VIN ≥
VDD – 0.10 V
Rev: 1.04 4/2005
11/25
Specifications cited are subject to change without notice. For latest documentation see http://www.gsitechnology.com.
© 2003, GSI Technology