FQP30N06(2003) Просмотр технического описания (PDF) - Fairchild Semiconductor

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FQP30N06
(Rev.:2003)

60V N-Channel MOSFET

Fairchild Semiconductor 

Peak Diode Recovery dv/dt Test Circuit & Waveforms

DUT

+

VDS

_

I SD

L

Driver

RG

Same Type

as DUT

VDD

VGS

• dv/dt controlled by RG

• ISD controlled by pulse period

VGS

( Driver )

I SD

( DUT )

VDS

( DUT )

D

=

--G--a--t-e--P--u--l-s-e---W---i-d-t-h--

Gate Pulse Period

10V

IFM , Body Diode Forward Current

di/dt

IRM

Body Diode Reverse Current

Body Diode Recovery dv/dt

VSD

VDD

Body Diode

Forward Voltage Drop

©2003 Fairchild Semiconductor Corporation

Rev. A2, March 2003

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