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29F040-12AC

4 MEGABIT (512K x8) 5 VOLT SECTOR ERASE CMOS FLASH MEMORY

Winbond 

BRIGHT

Microelectronics

Inc.

Preliminary BM29F040

Capacitance:

TA = 25° C, f = 1 MHZ (2)

Symbol

Parameter

Cin

Input Capacitance

Cout

Output Capacitance

Conditiontion

Vin = 0V

Vout = 0V

Typical

6

10

Max

Unit

8

pF

12

pF

AC Testing Input/Output Waveform

AC Testing Load Circuit

2.4

Input

0.45

2.0 Test

2.0

Points

0.8

0.8

Output

AC test inputs are driven at Voh ( 2.4V VTTL) for a

logic "1" and Vol ( 0.4V VTTL) for a logic "0". Input

timing measurement begins at Vih ( 2.0V VTTL) for an

input "1" and Vil ( 0.8V VTTL) fir an input "0".

Output timing measurement ends ar 2.0V for an output

"1" and 0.8V for an output "0". Input Rise and fall times

(10% to 90%) < 10ns.

2.7K

RL

Device Under

Test

CL

RL

CL = 100 pF

CL includes Jig Capacitance

The diodes are 1N3064 or

wequivalent.

6.2K

Figure 7. A.C.Testing Load and Waveforms

- 18 -

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