EL301X(P5) Series
5 PIN DIP RANDOM-PHASE TRIAC DRIVER EL302X(P5) Series
PHOTOCOUPLER
EL305X(P5) Series
Figure 8. Static dv/dt Test Circuit & Waveform
D.U.T.
T1
10 kΩ
A
K
VT
CTEST
RTEST
50 Ω
T2
High Voltage
Pulse Source
0.632 x VPEAK
Measurement Method
Applied VT
Waveform
τRC
VPEAK
0
The high voltage pulse is set to the required VPEAK value and applied to the D.U.T. output side through the RC
circuit above. LED current is not applied. The waveform VT is monitored using a x100 scope probe. By
varying RTEST, the dv/dt (slope) is increased, until the D.U.T. is observed to trigger (waveform collapses). The
dv/dt is then decreased until the D.U.T. stops triggering. At this point, τRC is recorded and the dv/dt calculated.
dv/dt = 0.632 x VPEAK
τRC
: Everlight Electronics Co., Ltd.
Document No DPC-0000075 Rev. 1
5
http://www.everlight.com
October 1,2011