PI6C9930S Просмотр технического описания (PDF) - Pericom Semiconductor
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PI6C9930S Datasheet PDF : 5 Pages
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PI6C9930
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Electrical Characteristics Over Operating Range
Symbol
Parameters
Test Conditions
Min. Max. Units
VOH Output HIGH Voltage
VOL Output LOW Voltage
VIH
Input HIGH Voltage
(REF and FB inputs only)
VCC = Min., IOH = -24 mA
VCC = Min., IOL = +24 mA
2.4
0.4
2.0 VCC V
VIL
Input LOW Voltage
(REF and FB inputs only)
-0.5 0.8
IIH
Input HIGH Leakage Current
(REF, Test, FS, and FB inputs only)
IIL
Input LOW Leakage Current
(REF, Test, FS, and FB inputs only)
IOS Output Short Circuit Current(2)
VCC = Max., VIN = Max.
VCC = Max., VIN = 0.4V
10
mA
-500
VCC = Max., VOUT = GND (25°C only)
-250
ICCQ
Operating Current
Used by Internal Circuitry
VCCN = VCCQ = Max.,
All Inputs Select Open
85 mA
ICCN
Output Buffer Current per Output Pair(3)
VCCN = VCCQ = Max., IOUT = 0 mA
Inputs Selects Open, fmax
14
PD
Power Dissipation per Output Pair(4)
VCCN = VCCQ = Max., IOUT = 0 mA
Inputs Selects Open, fMAX
78 mW
Notes:
1. If these inputs, which are normally wired to VCC, GND, are switched, the function
and timing of the outputs may glitch and the PLL may require an additional tLOCK
time before all datasheet limits are achieved.
2. Tested one output at a time, output shorted for less than one second, less than l0% duty
cycle. Room temperature only.
3. (TBD) Total output current per output pair is approximated by the following expression that
includes device current plus load current.
ICCN = [(4 + 0.11F) + [((835 - 3F)/Z) + (.0022FC)]N1] x 1.1
Where: F = frequency in MHz
Z = line impedance in ohms
C = capacitive load in pF
FC = F × C
N = number of loaded outputs: 0, l, or 2
4. (TBD) Total power dissipation per output pair can be approximated by the following expression that
includes device power dissipation plus power dissipation due to the load circuit:
PD = [(22 + 0.61F) + [((1550 - 2.7F)/Z) + (0.125FC)]N] × 1.1 (See note 3 for variable definition)
5. TBD
6. Applies to REF and FB inputs only. Tested initially and after any design or process
changes that may affect these parameters.
179
PS8096B 01/25/99
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