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ADG741
(Rev.:Rev0)

CMOS Low Voltage 2 Ω
SPST Switches in SC70 Packages

Analog Devices 

ADG741/ADG742–SPECIFICATIONS1 (VDD = 5 V ؎ 10%, GND = 0 V. All specifications –40؇C to +85؇C

unless otherwise noted.)

Parameter

ANALOG SWITCH

Analog Signal Range

On Resistance (RON)

On-Resistance Flatness (RFLAT(ON))

LEAKAGE CURRENTS2

Source OFF Leakage IS (OFF)

Drain OFF Leakage ID (OFF)

Channel ON Leakage ID, IS (ON)

DIGITAL INPUTS

Input High Voltage, VINH

Input Low Voltage, VINL

Input Current

IINL or IINH

DYNAMIC CHARACTERISTICS2

tON

tOFF

Charge Injection

B Version

25؇C

–40؇C to +85؇C

0 V to VDD

2

3

4

0.5

1.0

± 0.01

± 0.25

± 0.01

± 0.25

± 0.01

± 0.25

± 0.35

± 0.35

± 0.35

2.4

0.8

0.005

± 0.1

12

18

8

12

5

Off Isolation

–55

–75

Bandwidth –3 dB

200

CS (OFF)

17

CD (OFF)

17

CD, CS (ON)

38

POWER REQUIREMENTS

IDD

0.001

1.0

NOTES

1Temperature ranges are as follows: B Versions: – 40°C to +85°C.

2Guaranteed by design, not subject to production test.

Specifications subject to change without notice.

Unit

V

Ω typ

Ω max

Ω typ

Ω max

nA typ

nA max

nA typ

nA max

nA typ

nA max

V min

V max

µA typ

µA max

ns typ

ns max

ns typ

ns max

pC typ

dB typ

dB typ

MHz typ

pF typ

pF typ

pF typ

µA typ

µA max

Test Conditions/Comments

VS = 0 V to VDD, IS = –10 mA;

Test Circuit 1

VS = 0 V to VDD, IS = –10 mA

VDD = 5.5 V

VS = 4.5 V/1 V, VD = 1 V/4.5 V;

Test Circuit 2

VS = 4.5 V/1 V, VD = 1 V/4.5 V;

Test Circuit 2

VS = VD = 1 V, or 4.5 V;

Test Circuit 3

VIN = VINL or VINH

RL = 300 Ω, CL = 35 pF

VS = 3 V; Test Circuit 4

RL = 300 Ω, CL = 35 pF

VS = 3 V; Test Circuit 4

VS = 2 V, RS = 0 Ω, CL = 1 nF;

Test Circuit 5

RL = 50 Ω, CL = 5 pF, f = 10 MHz

RL = 50 Ω, CL = 5 pF, f = 1 MHz;

Test Circuit 6

RL = 50 Ω, CL = 5 pF;

Test Circuit 7

VDD = 5.5 V

Digital Inputs = 0 V or 5 V

–2–

REV. 0

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