AD1876 Просмотр технического описания (PDF) - Analog Devices
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AD1876 Datasheet PDF : 12 Pages
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AD1876
DIGITAL SPECIFICATIONS (TMIN to TMAX, VCC = +12 V ؎ 5%, VEE = –12 V ؎ 5%, VDD = +5 V ؎ 10%)
Parameter
Test Conditions
Min
Typ
Max
Units
LOGIC INPUTS
VIH
High Level Input Voltage
2.4
VIL
Low Level Input Voltage
–0.3
IIH
High Level Input Current
VIH = VDD
–10
IIL
Low Level Input Current
VIL = 0 V
–10
CIN
Input Capacitance
V
0.8
V
+10
µA
+10
µA
10
pF
LOGIC OUTPUTS
VOH
High Level Output Voltage
VOL
Low Level Output Voltage
IOH = 0.1 mA
IOH = 0.5 mA
IOL = 1.6 mA
VDD – 1 V
2.4
V
V
0.4
V
Specifications subject to change without notice.
Specifications shown in boldface are tested on all devices at final electrical test at worst case temperature. Results from those tests are used to calculate outgoing qual-
ity levels. All min and max specifications are guaranteed, although only those shown in boldface are tested.
ABSOLUTE MAXIMUM RATINGS*
VCC to VEE . . . . . . . . . . . . . . . . . . . . . . . . . . –0.3 V to +26.4 V
VDD to DGND . . . . . . . . . . . . . . . . . . . . . . . . . –0.3 V to +7 V
VCC to AGND . . . . . . . . . . . . . . . . . . . . . . . . –0.3 V to +18 V
VEE to AGND . . . . . . . . . . . . . . . . . . . . . . . . –18 V to +0.3 V
AGND to DGND . . . . . . . . . . . . . . . . . . . . . . . . . . . . ± 0.3 V
Digital Inputs to DGND . . . . . . . . . . . . . . . . . . . 0 V to 5.5 V
Analog Inputs, VREF to AGND . . . . . . . . . . . (VCC + 0.3 V) to
(VEE – 0.3 V)
Soldering . . . . . . . . . . . . . . . . . . . . . . . . . . . . . +300°C, 10 sec
Storage Temperature . . . . . . . . . . . . . . . . . . –60°C to +100°C
*Stresses greater than those listed under “Absolute Maximum Ratings” may
cause permanent damage to the device. This is a stress rating only and
functional operation of the device at these or any other conditions above those
indicated in the operational section of this specification is not implied. Exposure
to absolute maximum rating conditions for extended periods may affect device
reliability.
CAUTION
ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily
accumulate on the human body and test equipment and can discharge without detection.
Although the AD1876 features proprietary ESD protection circuitry, permanent damage may
occur on devices subjected to high energy electrostatic discharges. Therefore, proper ESD
precautions are recommended to avoid performance degradation or loss of functionality.
WARNING!
ESD SENSITIVE DEVICE
TIMING SPECIFICATIONS1
(TMIN to TMAX, VCC = +12 V ؎ 5%, VEE = –12 V ؎ 5%, VDD = +5 V ؎ 10%, VREF = 5.00 V)
Parameter
Symbol
Min
Typ
Max
Units
Sampling Rate2
fS = 1/tS
1
100
kSPS
Sampling Period2
tS = l/fS
10
1000
µs
Acquisition Time (Included in tS)
tA
2
µs
Calibration Time
tCT
5000
tC
CLK Period
tC
480
ns
CAL to BUSY Delay
tCALB
0
ns
CLK to BUSY Delay
tCB
50
120
175
ns
CLK to DOUT Hold Time
tCD
10
ns
CLK HIGH
tCH
160
ns
CLK LOW
tCL
50
ns
DOUT CLK LOW
tDCL
30
80
200
ns
SAMPLE LOW to 1st CLK Delay
tSC
50
ns
CAL HIGH Time
tCALH
4
tC
CLK to DOUT CLK
tCDH
150
200
275
ns
SAMPLE LOW
tSL
50
ns
NOTES
1See Figure 1 and Figure 2 and the Conversion Control and Autocalibration sections for detailed explanations of the above timing.
2Depends upon external clock frequency; includes acquisition time and conversion time. The minimum sampling rate/maximum sampling period is specified to
account for droop of the internal sample/hold. Operation at slower rates than specified may degrade performance.
REV. A
–3–
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