74LVQ174T Просмотр технического описания (PDF) - STMicroelectronics

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74LVQ174T

HEX D-TYPE FLIP FLOP WITH CLEAR

STMicroelectronics 

74LVQ174

TEST CIRCUIT

CL = 50 pF or equivalent (includes jigand probe capacitance)

RL = R1 = 500Ω orequivalent

RT = ZOUT of pulse generator (typically 50Ω)

WAVEFORM 1: PROPAGATION DELAYS, SETUP AND HOLD TIMES, CLOCK PULSE WIDTH

(f=1MHz; 50% duty cycle)

6/10

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