74F280 Просмотр технического описания (PDF) - Philips Electronics
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74F280 Datasheet PDF : 8 Pages
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Philips Semiconductors
9-bit odd/even parity generator/checker
Product specification
74F280B
ABSOLUTE MAXIMUM RATINGS
SYMBOL
PARAMETER
VCC
VIN
IIN
VOUT
IOUT
Supply voltage
Input voltage
Input current
Voltage applied to output in High output state
Current applied to output in Low output state
Tamb
Operating free-air temperature range
Tstg
Storage temperature
Commercial range
Industrial range
RECOMMENDED OPERATING CONDITIONS
SYMBOL
PARAMETER
VCC
VIH
VIL
IIK
IOH
IOL
Tamb
Supply voltage
High-level input voltage
Low-level input voltage
Input clamp current
High-level output current
Low-level output current
Operating free-air temperature range
Commercial range
Industrial range
RATING
–0.5 to +7.0
–0.5 to +7.0
–30 to +5
–0.5 to VCC
40
0 to +70
–40 to +85
–65 to +150
UNIT
V
V
mA
V
mA
°C
°C
°C
LIMITS
Min Nom Max
4.5
5.0
5.5
2.0
0.8
–18
–1
20
0
70
–40
85
UNIT
V
V
V
mA
mA
mA
°C
°C
DC ELECTRICAL CHARACTERISTICS
(Over recommended operating free-air temperature range unless otherwise noted.)
SYMBOL
PARAMETER
TEST CONDITIONS1
LIMITS
MIN TYP2 MAX
UNIT
VOH
High-level output voltage
VCC = MIN, VIL = MAX ±10%VCC
2.5
V
VIH = MIN, IOH = MAX ±5%VCC
2.7
3.4
VOL
Low-level output voltage
VCC = MIN, VIL = MAX ±10%VCC
VIH = MIN, IOL = MAX ±5%VCC
0.35 0.50
V
0.35 0.50
VIK
Input clamp voltage
VCC = MIN, II = IIK
–0.73 –1.2
V
II
Input current at maximum input voltage
VCC = 0.0V, VI = 7.0V
100
µA
Commercial range
IIH
High-level input current
VCC = MAX, VI = 2.7V
Industrial range
20
µA
40
µA
IIL
Low-level input current
IOS
Short-circuit output current3
VCC = MAX, VI = 0.5V
VCC = MAX
–20
µA
–60
–150
mA
ICC
Supply current (total)
VCC = MAX
26
35
mA
NOTES:
1. For conditions shown as MIN or MAX, use the appropriate value specified under recommended operating conditions for the applicable type.
2. All typical values are at VCC = 5V, Tamb = 25°C.
3. Not more than one output should be shorted at a time. For testing IOS, the use of high-speed test apparatus and/or sample-and-hold
techniques are preferable in order to minimize internal heating and more accurately reflect operational values. Otherwise, prolonged shorting
of a High output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests. In any
sequence of parameter tests, IOS tests should be performed last.
1996 Mar 12
4
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