74F191 Просмотр технического описания (PDF) - Philips Electronics
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74F191 Datasheet PDF : 14 Pages
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Philips Semiconductors
Up/Down binary counter with reset and ripple clock
Product specification
74F191
ABSOLUTE MAXIMUM RATINGS
(Operation beyond the limits set forth in this table may impair the useful life of the device.
Unless otherwise noted these limits are over the operating free-air temperature range.)
SYMBOL
PARAMETER
VCC
VIN
IIN
VOUT
IOUT
Tamb
Tstg
Supply voltage
Input voltage
Input current
Voltage applied to output in High output state
Current applied to output in Low output state
Operating free-air temperature range
Storage temperature
RATING
–0.5 to +7.0
–0.5 to +7.0
–30 to +5.0
–0.5 to +VCC
40
0 to +70
–65 to +150
UNIT
V
V
mA
V
mA
oC
oC
RECOMMENDED OPERATING CONDITIONS
SYMBOL
PARAMETER
VCC
VIH
VIL
IIK
IOH
IOL
Tamb
Supply voltage
High-level input voltage
Low-level input voltage
Input clamp current
High-level output current
Low-level output current
Operating free-air temperature range
LIMITS
Min Nom Max
4.5
5.0
5.5
2.0
0.8
–18
–1
20
0
70
UNIT
V
V
V
mA
mA
mA
oC
DC ELECTRICAL CHARACTERISTICS
(Over recommended operating free-air temperature range unless otherwise noted.)
SYMBOL
PARAMETER
TEST CONDITIONS1
LIMITS
Min
Typ2 Max
UNIT
VOH
High-level output voltage
VCC = Min, VIL = Max,
IOH = Max, VIH = Min
±10%VCC
2.5
±5%VCC
2.7
3.4
V
V
VOL
Low-level output voltage
VCC = Min, VIL = Max,
IOL = Max, VIH = Min
±10%VCC
±5%VCC
0.30 0.50
V
0.30 0.50
V
VIK
Input clamp voltage
VCC = Min, II = IIK
–0.73 –1.2
V
II
Input current at maximum input voltage VCC = Max, VI = 7.0V
100
µA
IIH
High-level input current
VCC = Max, VI = 2.7V
20
µA
IIL
Low-level input current
CE
VCC = Max, VI = 0.5V
Others
–1.8
mA
–0.6
mA
IOS
Short-circuit output current3
VCC = Max
–60
–150
mA
ICC
Supply current4 (total)
VCC = Max
40
55
mA
NOTES:
1. For conditions shown as MIN or MAX, use the appropriate value specified under recommended operating conditions for the applicable type.
2. All typical values are at VCC = 5V, Tamb = 25°C.
3. Not more than one output should be shorted at a time. For testing IOS, the use of high-speed test apparatus and/or sample-and-hold
techniques are preferable in order to minimize internal heating and more accurately reflect operational values. Otherwise, prolonged shorting
of a High output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests. In any
sequence of parameter tests, IOS tests should be performed last.
4. Measure ICC all inputs grounded and all outputs open.
1995 Jul 17
6
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