74AHC257 Просмотр технического описания (PDF) - NXP Semiconductors.

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74AHC257

Quad 2-input multiplexer; 3-state

NXP Semiconductors. 

Nexperia

74AHC257; 74AHCT257

Quad 2-input multiplexer; 3-state

VI 90 %

tW

negative

pulse

VM

10 %

0V

tf

VI

positive

pulse

tr

90 %

VM

10 %

0V

tW

VM

tr

tf

VM

VI

G

VCC

VO

DUT

RT

VCC

RL S1

CL

open

001aad983

Fig 8.

Test data is given in Table 9.

Definitions test circuit:

RT = termination resistance should be equal to output impedance Zo of the pulse generator.

CL = load capacitance including jig and probe capacitance.

RL = load resistance.

S1 = test selection switch.

Test circuitry for measuring switching times

Table 9. Test data

Type

Input

74AHC257

74AHCT257

VI

VCC

3.0 V

tr, tf

≤ 3.0 ns

≤ 3.0 ns

Load

CL

15 pF, 50 pF

15 pF, 50 pF

RL

1 kΩ

1 kΩ

S1 position

tPHL, tPLH

open

open

tPZH, tPHZ

GND

GND

tPZL, tPLZ

VCC

VCC

74AHC_AHCT257_2

Product data sheet

Rev. 02 — 9 May 2008

© Nexperia B.V. 2017. All rights reserved

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