M29W010B55K6E Просмотр технического описания (PDF) - STMicroelectronics

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M29W010B55K6E

1 Mbit (128Kb x8, Uniform Block) Low Voltage Single Supply Flash Memory

STMicroelectronics 

M29W010B

Table 8. AC Measurement Conditions

Parameter

VCC Supply Voltage

Load Capacitance (CL)

Input Rise and Fall Times

Input Pulse Voltages

Input and Output Timing Ref. Voltages

45

3.0 to 3.6V

30pF

≤10ns

0 to 3V

1.5V

M29W010B

55

2.7 to 3.6V

30pF

≤10ns

0 to 3V

1.5V

70 / 90

2.7 to 3.6V

100pF

≤10ns

0 to 3V

1.5V

Figure 6. AC Testing Input Output Waveform

3V

1.5V

0V

AI01417

Figure 7. AC Testing Load Circuit

0.8V

1N914

DEVICE

UNDER

TEST

3.3kΩ

OUT

CL = 30pF or 100pF

Table 9. Capacitance

(TA = 25 °C, f = 1 MHz)

Symbol

Parameter

CIN

Input Capacitance

COUT

Output Capacitance

Note: Sampled only, not 100% tested.

CL includes JIG capacitance

AI02762

Test Condition

VIN = 0V

VOUT = 0V

Min

Max

Unit

6

pF

12

pF

10/19

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