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X9116WM8

Digitally Controlled Potentiometer (XDCP™)

Intersil 

X9116

DC Electrical Specifications Over recommended operating conditions unless otherwise specified

SYMBOL

PARAMETER

TEST CONDITIONS

MIN TYP (Note 4) MAX UNIT

ICC1

VCC active current (Increment)

CS = VIL, U/D = VIL or VIH and

INC = 0.4V/2.4V @ max tCYC

ICC2

VCC active current (Store) (EEPROM Store) CS = VIH, U/D = VIL or VIH and

INC = VIH @ max tWR

ISB

Standby supply current

CS = VCC–0.3V, U/D and INC = VSS or

VCC–0.3V

ILI

CS, INC, U/D input leakage current

VIN = VSS to VCC

VIH

CS, INC, U/D input HIGH voltage

2V

VIL

CS, INC, U/D input LOW voltage

-0.5

CIN (Note 5) CS, INC, U/D input capacitance

VCC = 5V, VIN = VSS, TA = 25°C,

f = 1MHz

150

µA

400

µA

1

µA

±10

µA

VCC + 0.5 V

0.8

V

10

pF

4. Typical values are for TA = 25°C and nominal supply voltage.

5. This parameter is periodically sampled and not 100% tested.

Endurance And Data Retention

PARAMETER

Minimum endurance

Data retention

MIN

100,000

100

UNIT

Data changes per bit

Years

Test Circuit #1

Test Circuit #2

Circuit #3 SPICE Macro Model

VH/RH

VS

Test Point

VW/RW

VL/RL

A.C. Conditions of Test

Input pulse levels

Input rise and fall times

Input reference levels

0V to 3V

10ns

1.5V

VH/RH

Test Point

VWV/RWW

Force

VL/RL

Current

RTOTAL

RH

RL

CH

CW

CL

10pF

10pF

25pF

RW

5

FN8160.1

September 12, 2005

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