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IDT72V36100

3.3 VOLT HIGH-DENSITY SUPERSYNC II™ 36-BIT FIFO

Integrated Device Technology 

IDT72V36100/72V36110 3.3V HIGH DENSITY SUPERSYNC IITM 36-BIT FIFO

65,536 x 36 and 131,072 x 36

COMMERCIAL AND INDUSTRIAL

TEMPERATURE RANGES

PIN DESCRIPTION-CONTINUED (TQFP & PBGA PACKAGES)

Symbol

Name

I/O

Description

SEN

Serial Enable

I SEN enables serial loading of programmable flag offsets.

WCLK/

WR

Write Clock/

Write Strobe

I If Synchronous operation of the write port has been selected, when enabled by WEN, the rising edge of WCLK

writes data into the FIFO. If Asynchronous operation of the write port has been selected, WR writes data into the FIFO

on a rising edge in an Asynchronous manner, (WEN should be tied to its active state). Asynchronous operation of

the WCLK/WR input is only available in the PBGA package.

WEN

Write Enable

VCC

+3.3V Supply

I WEN enables WCLK for writing data into the FIFO memory and offset registers.

I These are VCC supply inputs and must be connected to the 3.3V supply rail.

NOTE:

1. Inputs should not change state after Master Reset.

PIN DESCRIPTION (PBGA PACKAGE ONLY)

Symbol

ASYR(1)

ASYW(1)

Name

Asynchronous

Read Port

Asynchronous

Write Port

I/O

Description

I A HIGH on this input during Master Reset will select Synchronous read operation for the output port. A LOW

will select Asynchronous operation. If Asynchronous is selected the FIFO must operate in IDT Standard mode.

I A HIGH on this input during Master Reset will select Synchronous write operation for the input port. A LOW

will select Asynchronous operation.

TCK(2)

JTAG Clock

I Clock input for JTAG function. One of four terminals required by IEEE Standard 1149.1-1990. Test operations of the

device are synchronous to TCK. Data from TMS and TDI are sampled on the rising edge of TCK and outputs change

on the falling edge of TCK. If the JTAG function is not used this signal needs to be tied to GND.

TDI(2)

JTAG Test Data I One of four terminals required by IEEE Standard 1149.1-1990. During the JTAG boundary scan operation, test data

Input

serially loaded via the TDI on the rising edge of TCK to either the Instruction Register, ID Register and Bypass Register.

An internal pull-up resistor forces TDI HIGH if left unconnected.

TDO(2)

JTAG Test Data

Output

O One of four terminals required by IEEE Standard 1149.1-1990. During the JTAG boundary scan operation, test data

serially loaded output via the TDO on the falling edge of TCK from either the Instruction Register, ID Register and Bypass

Register. This output is high impedance except when shifting, while in SHIFT-DR and SHIFT-IR controller states.

TMS(2) JTAG Mode

I TMSisaserialinputpin.OneoffourterminalsrequiredbyIEEEStandard1149.1-1990.TMSdirectsthedevicethrough

its TAP controller states. An internal pull-up resistor forces TMS HIGH if left unconnected.

TRST(2) JTAG Reset

I TRST is an asynchronous reset pin for the JTAG controller. The JTAG TAP controller will automatically reset upon

power-up. If the JTAG function is not used then this signal should to be tied to GND.

NOTES:

1. Inputs should not change state after Master Reset.

2. These pins are for the JTAG port. Please refer to pages 43-47 and Figures 31-33.

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