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ISL6265C

Multi-Output Controller with Integrated MOSFET Drivers for AMD SVI Capable Mobile CPUs

Intersil 

ISL6265C

Electrical Specifications VCC = PVCC = 5V, VIN = 12V, TA = -10°C to +100°C, Unless Otherwise Specified. Boldface

limits apply over the operating temperature range, -10°C to +100°C. (Continued)

PARAMETER

SYMBOL

TEST CONDITIONS

MIN

MAX

(Note 6) TYP (Note 6) UNITS

Overvoltage Threshold

OVHS

VO rising above threshold > 0.5µs

OVERCURRENT PROTECTION VDD0 AND VDD1

1.770 1.800 1.825

V

OCSET Reference Voltage

(VISPx - VISNx)

OVERCURRENT PROTECTION VDD_NB

VOCSET = 180mV; VIN = 15.5V

5

6.0

7

mV

OCSET_NB OCP Current

RBIAS pin to GND = 117kΩ; Trips after

9.2

8 PWM cycles

10

10.8

µA

OFFSET FUNCTION

OFS Pin Voltage For Droop

Enabling

VOFS

ROFS = 240kΩ (OFS pin to GND)

1.18

1.2

1.22

V

FB Pin Source Current

OFS Pin Voltage Threshold for

VFIX Mode and No Droop

Operation

IFB

VOFS

IOFS = =10µA

9.0

9.9

10.8

µA

-

1.8

-

V

OFS Pin Voltage Threshold for

SVI Mode and No Droop

Operation

VOFS

-

4.0

-

V

OFS Bias

LOGIC INPUTS

IOFS

1.8V < OFS < VCC

-

4.0

-

µA

ENABLE Low Threshold

ENABLE High Threshold

ENABLE Leakage Current

VIL(3.3V)

VIH(3.3V)

Logic input is low

-

1.35

0.9

V

2.0

1.6

-

V

-1

0

-

µA

Logic input is high at 3.3V

-

0

1

µA

SVI INTERFACE

PWROK Input Low Threshold

-

0.65

0.8

V

PWROK Input High Threshold

-

0.9

-

V

SVC, SVD Input HIGH (VIH)

1.05

0.87

-

V

SVC, SVD Input LOW (VIL)

-

0.68

0.45

V

Schmitt Trigger Input

Hysteresis

-

0.19

-

V

SVD Low Level Output Voltage

3mA Sink Current

-

0.1

0.285

V

SVC, SVD Leakage

EN = 0V, SVC, SVD = 0V

-

< -100

-

nA

EN = 5V, SVC, SVD = 1.8V

-

< -100

-

nA

DIFF AMP

Accuracy

VSEN = 0.5V to 1.55V; RTN = 0 ±0.1V

-2

-

2

mV

NOTES:

6. Parameters with MIN and/or MAX limits are 100% tested at +25°C, unless otherwise specified. Temperature limits established

by characterization and are not production tested

7. Limits should be considered typical and are not production tested.

8. Limits established by characterization and are not production tested.

12

FN6976.1

July 28, 2010

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