MAX785 Просмотр технического описания (PDF) - Maxim Integrated

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MAX785

Product Reliability Report

Maxim Integrated 

December 1997

Product

Reliability Report

This report presents the product reliability data for

Maxim’s analog products. The data was acquired from

extensive reliability stress testing performed in 1996. It is

separated into seven fabrication processes: 1) Standard

Metal-Gate CMOS (SMG); 2) Medium-Voltage Metal-Gate

CMOS (MV1); 3) Medium-Voltage Silicon-Gate CMOS

(MV2); 4) 3µm Silicon-Gate CMOS (SG3); 5) 5µm Silicon-

Gate CMOS (SG5); 6) 1.2µm Silicon-Gate CMOS; and

7) Bipolar (BIP) processes.

Over 8,967,000 device hours have been accumulated for

products stressed at an elevated temperature (135°C)

during this period. The data in this report is considered

typical of Maxim’s production. As you will see, Maxim’s

products demonstrate consistently high reliability.

_____________________________________________________________________________ Maxim Integrated Products

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