APW7047 Просмотр технического описания (PDF) - Anpec Electronics
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APW7047 Datasheet PDF : 12 Pages
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APW7047
Reliability test program
Test item
SOLDERABILITY
HOLT
PCT
TST
ESD
Latch-Up
Method
MIL-STD-883D-2003
MIL-STD-883D-1005.7
JESD-22-B, A102
MIL-STD-883D-1011.9
MIL-STD-883D-3015.7
JESD 78
Description
245°C , 5 SEC
1000 Hrs Bias @ 125 °C
168 Hrs, 100 % RH , 121°C
-65°C ~ 150°C, 200 Cycles
VHBM > 2KV, VMM > 200V
10ms , Itr > 100mA
Carrier Tape & Reel Dimensions
t
Po
P
D
E
P1
F
Bo
W
Ao
D1
Ko
T2
J
C
A
B
T1
Application
SOP- 24
A
330±1
F
B
62 ±1.5
D
C
12.75 ±
0.15
D1
J
2 ± 0.6
Po
T1
24.4 ± 0.2
P1
T2
2± 0.2
Ao
W
24 ± 0.3
Bo
P
E
12 ± 0.1 1.75± 0.1
Ko
t
11.5 ± 0.1 1.55 +0.1 1.5+ 0.25 4.0 ± 0.1 2.0 ± 0.1 10.9 ± 0.1 15.9± 0.1 3.1± 0.1 0.35±0.05
Copyright ANPEC Electronics Corp. Rev. A.
11
Rev.A.1 - May., 2002
www.anpec.com.tw
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