LESHAN RADIO COMPANY, LTD.
OPEN LOOP TEST CIRCUITS
MDC5001T1
Figure 10. I CC versus V CC Test Circuit
Figure 11. V ref versus V CC Test Circuit
Figure 12. V ref versus T J Test Circuit
Figure 13. H FE versus I out Test Circuit
Figure 14. I ENBL versus V ENBL Test Circuit
Figure 15. V ref versus V ENBL Test Circuit
NOTE 1: V BE3 is used to simulate actual operating conditions that reduce V CE2 & H FE2 , and increase I B2 & V ref .
MDC5001T–7/10