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DS2186SN Просмотр технического описания (PDF) - Dallas Semiconductor -> Maxim Integrated

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Компоненты Описание
Список матч
DS2186SN
Dallas
Dallas Semiconductor -> Maxim Integrated Dallas
DS2186SN Datasheet PDF : 11 Pages
1 2 3 4 5 6 7 8 9 10
DS2186
CHARACTERISTICS OF T1 AND CEPT INTERFACES Table 3
CHARACTERISTIC
T1
CEPT
LINE RATE
LINE CODE
1.544 MHz
AMI1 or B8ZS
2.048 MHz
AMI or HDB3
TEST LOAD IMPEDANCE
100 ohm Resistive
120 ohm Resistive (wire pair)
75 ohm Resistive (coax)
NOMINAL PEAK
VOLTAGE
2.4V to 3.6 V2
3.0V (wire pair)
2.37V (coax)
PULSE SHAPE
–Scaled to fit templates shown–
NOMINAL PULSE WIDTH
324 ns
244 ns
PULSE IMBALANCE
< 0.5 dB difference between
total power of positive and
negative pulses.
1) Negative peak = positive peak ±5%
2) Positive width at nominal half ampli-
tude = negative width at nominal half
amplitude ±5%.
NOTES:
1. With a ones density of at least 12.5% and no more than 15 consecutive zeros.
2. Measured at the cross–connect (DSX–1) point; CSU applications may be 7.5 to 15 dB below these levels.
022798 7/11

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