PI74SSTV16859(2000) Просмотр технического описания (PDF) - Pericom Semiconductor
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PI74SSTV16859 Datasheet PDF : 7 Pages
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ADVANCE INFORMATION
PI74SSTV16859
13-Bit to 26-Bit Registered Buffer
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Test Circuit and Switching Waveforms
LVRCEMInSOpEuSTt
VDD/2
tinact
IDD(9)
10%
VDD
0V
tact
90% IDDH
IDDL
Voltage and Current Waveforms
Input Active and Inactive Times
tw
Input
VREF
VIH
VREF
VIL
Voltage Waveforms - Pulse Duration
From Output
Under Test
VTT
RL = 50Ω
TEST POINT
CL = 30pF(8)
Load Circuit
Timing
Input
VICR
VICR
VI(PP)
Output
t PLH
VTT
t PHL
VTT
VOH
VOL
Voltage Waveforms - Propagation Delay Times
Timing
Input
Input
tsu
VICR
th
VREF
VREF
VI(PP)
VIH
VIL
Voltage Waveforms - Setup and Hold Times
LVCMOS
RESET
Input
Output
VDD/2
t PHL
VIH
VTT
VIL
VOH
VOL
Voltage Waveforms - Propagation Delay Times
Parameter Measurement Information (VDD = 2.5V ±0.2V)
Notes:
8. CL includes probe and jig capacitance.
9. IDD tested with clock and data inputs held at VDD or GND, and IO = 0mA.
10. All input pulses are supplied by generators having the following characteristics:
PRR ≤10 MHz, ZO = 50Ω. Input slew rate = 1V/ns ±20% (unless otherwise specified).
11. The outputs are measured one at a time with one transition per measurement.
12. VTT = VREF = VDDQ/2
13. VIH = VREF + 350mV (ac voltage levels) for SSTL inputs. VIH = VDD for LVCMOS input.
14. VIL = VREF + 350mV (ac voltage levels) for SSTL inputs. VIL = GND for LVCMOS input.
15. tPLH and tPHL are the same as tpd.
6
PXXXX 07/27/00
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