DG300 Просмотр технического описания (PDF) - Maxim Integrated

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DG300

TTL Compatible CMOS Analog Switches

Maxim Integrated 

TTL Compatible CMOS Analog Switches

Test Circuits

ΔVO

RGEN

SX

VGEN

DX

INX

Figure 1. Charge Injection Test Circuit

VO

CL

10nF

VO

+4V

INX

ON

ΔVO = Δ MEASURED VOLTAGE ERROR DUE TO CHARGE INJECTION

THE ERROR VOLTAGE IN COULOMBS IS ΔQ = CL x ΔVO.

ON

OFF

0V

LOGIC

INPUT

0V

VS1

SWITCH

OUTPUT

VO1

0V

LOGIC "1" = SWITCH ON

VIHN

50%

+4V

50%

SWITCH

OUTPUT

VS2

VO2

50%

0V

S1

VS1 = 3V

S2

VS2 = 3V

IN

LOGIC

INPUT

tBBM

Figure 2. Break-Before-Make Time Test Circuit SPDT (DG301(A), DG303(A)

+15V

V+

D1

D2

RL2

RL1

CL2

300Ω 300Ω 33pF

SWITCH

OUTPUT

VO1

VO2

CL1

33pF

GND

V-

-15V

LOGIC

INPUT

tR < 20ns

tF < 20ns 0V

VS

SWITCH

OUTPUT

0V

LOGIC "1" = SWITCH ON

VIHN

50%

+4V

90%

10%

S

VS = 3V

IN

LOGIC

INPUT

+15V

V+

0

RL

CL

300Ω 33pF

SWITCH

OUTPUT

VO

GND

V-

-15V

tON

tOFF

Figure 3. Switching Time Test Circuit

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