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74VHCT257A(2004) Просмотр технического описания (PDF) - STMicroelectronics

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74VHCT257A
(Rev.:2004)
ST-Microelectronics
STMicroelectronics ST-Microelectronics
74VHCT257A Datasheet PDF : 13 Pages
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74VHCT257A
Table 8: Capacitive Characteristics
Test Condition
Value
Symbol
Parameter
CIN
COUT
CPD
Input Capacitance
Output
Capacitance
Power Dissipation
Capacitance
(note 1)
TA = 25°C
-40 to 85°C -55 to 125°C Unit
Min. Typ. Max. Min. Max. Min. Max.
4 10
10
10 pF
6
pF
23
pF
1) CPD is defined as the value of the IC’s internal equivalent capacitance which is calculated from the operating current consumption without
load. (Refer to Test Circuit). Average operating current can be obtained by the following equation. ICC(opr) = CPD x VCC x fIN + ICC/4 (per
Channel)
Table 9: Dynamic Switching Characteristics
Symbol
Parameter
VOLP
VOLV
VIHD
VILD
Dynamic Low
Voltage Quiet
Output (note 1, 2)
Dynamic High
Voltage Input
(note 1, 3)
Dynamic Low
Voltage Input
(note 1, 3)
Test Condition
VCC
(V)
5.0
5.0
CL = 50 pF
5.0
Value
TA = 25°C
-40 to 85°C -55 to 125°C Unit
Min. Typ. Max. Min. Max. Min. Max.
0.3 0.8
-0.8 -0.3
2.0
V
0.8
1) Worst case package.
2) Max number of outputs defined as (n). Data inputs are driven 0V to 3.0V, (n-1) outputs switching and one output at GND.
3) Max number of data inputs (n) switching. (n-1) switching 0V to 3.0V. Inputs under test switching: 3.0V to threshold (VILD), 0V to threshold
(VIHD), f=1MHz.
5/13

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