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HI5735KCBZ Просмотр технического описания (PDF) - Intersil

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HI5735KCBZ Datasheet PDF : 11 Pages
1 2 3 4 5 6 7 8 9 10
HI5735
Electrical Specifications AVEE, DVEE = -4.94 to -5.46V, VCC = +4.75 to +5.25V, VREF = Internal TA = 25oC for All Typical Values (Con-
PARAMETER
TEST CONDITIONS
MIN TYP MAX UNITS
REFERENCE/CONTROL AMPLIFIER
Internal Reference Voltage, VREF
Internal Reference Voltage Drift
(Note 4)
(Note 3)
-1.27
-
-1.23
50
-1.17
-
V
µV/oC
Internal Reference Output Current Sink/Source
Capability
(Note 3)
-125
-
+50
µA
Internal Reference Load Regulation
Input Impedance at REF OUT pin
IREF = 0 to IREF = -125µA
(Note 3)
-
50
-
µV
-
1.4
-
k
Amplifier Large Signal Bandwidth (0.6VP-P)
Amplifier Small Signal Bandwidth (0.1VP-P)
Reference Input Impedance
Sine Wave Input, to Slew Rate Limited (Note 3)
Sine Wave Input, to -3dB Loss (Note 3)
(Note 3)
-
3
-
MHz
-
10
-
MHz
-
12
-
k
Reference Input Multiplying Bandwidth (CTL IN)
RL = 50, 100mV Sine Wave, to -3dB Loss at IOUT
-
(Note 3)
200
-
MHz
DIGITAL INPUTS (D9-D0, CLK, INVERT)
Input Logic High Voltage, VIH
Input Logic Low Voltage, VIL
Input Logic Current, IIH
Input Logic Current, IIL
Digital Input Capacitance, CIN
TIMING CHARACTERISTICS
(Note 4)
(Note 4)
(Note 4)
(Note 4)
(Note 3)
2.0
-
-
V
-
-
0.8
V
-
-
400
µA
-
-
700
µA
-
3.0
-
pF
Data Setup Time, tSU
Data Hold Time, tHLD
Propagation Delay Time, tPD
CLK Pulse Width, tPW1, tPW2
POWER SUPPLY CHARACTERISITICS
See Figure 1 (Note 3)
See Figure 1 (Note 3)
See Figure 1 (Note 3)
See Figure 1 (Note 3)
3.0
2.0
-
ns
0.5 0.25
-
ns
-
4.5
-
ns
3.0
-
-
ns
IEEA
IEED
ICCD
Power Dissipation
(Note 4)
(Note 4)
(Note 4)
(Note 4)
-
42
50
mA
-
70
85
mA
-
13
20
mA
-
650
-
mW
Power Supply Rejection Ratio
VCC ±5%, VEE ±5%
-
5
-
µA/V
NOTES:
2. Gain Error measured as the error in the ratio between the full scale output current and the current through RSET (typically 1.28mA). Ideally the
ratio should be 16.
3. Parameter guaranteed by design or characterization and not production tested.
4. All devices are 100% tested at 25oC. 100% production tested at temperature extremes for military temperature devices, sample tested for
industrial temperature devices.
5. Dynamic Range must be limited to a 1V swing within the compliance range.
4

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